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Author:

Dong, Guo-Bo (Dong, Guo-Bo.) | Zhang, Ming (Zhang, Ming.) | Wang, Mei (Wang, Mei.) | Li, Ying-Zi (Li, Ying-Zi.) | Li, Chao-Rong (Li, Chao-Rong.) | Li, Hua (Li, Hua.) | Huang, An-Ping (Huang, An-Ping.) | Yan, Hui (Yan, Hui.)

Indexed by:

EI Scopus PKU CSCD

Abstract:

The Cu2O thin films were deposited by radio-frequency(RF) magnetron sputtering at different substrate temperatures. The effect of substrate temperature on the crystal structure, optical and electrical properties were studied. The X-ray diffraction patterns show that the single-phase Cu2O was obtained and present a preferred growth orientation (111) as the substrate temperatures increased from 500 K to 800 K. The room temperature conductivity and optotical bandgap(Eg) increase as the substrate temperature increasing. The biggest Eg, 2.58 eV, is achieved for the sample prepared at 800 K.

Keyword:

Electric properties Thin films Substrates Electric conductivity X ray diffraction

Author Community:

  • [ 1 ] [Dong, Guo-Bo]School of Physics and Nuclear Energy Engineering, Beihang University, Beijing 100191, China
  • [ 2 ] [Zhang, Ming]College of Materials Science and Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 3 ] [Wang, Mei]School of Physics and Nuclear Energy Engineering, Beihang University, Beijing 100191, China
  • [ 4 ] [Li, Ying-Zi]School of Physics and Nuclear Energy Engineering, Beihang University, Beijing 100191, China
  • [ 5 ] [Li, Chao-Rong]School of Physics and Nuclear Energy Engineering, Beihang University, Beijing 100191, China
  • [ 6 ] [Li, Hua]School of Physics and Nuclear Energy Engineering, Beihang University, Beijing 100191, China
  • [ 7 ] [Huang, An-Ping]School of Physics and Nuclear Energy Engineering, Beihang University, Beijing 100191, China
  • [ 8 ] [Yan, Hui]College of Materials Science and Engineering, Beijing University of Technology, Beijing 100124, China

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Source :

Journal of Synthetic Crystals

ISSN: 1000-985X

Year: 2012

Issue: 2

Volume: 41

Page: 457-460,467

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 9

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