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Author:

Sun, Guo-Qin (Sun, Guo-Qin.) (Scholars:孙国芹) | Shang, De-Guang (Shang, De-Guang.) (Scholars:尚德广) | Ding, Lei (Ding, Lei.) | Deng, Jing (Deng, Jing.) | Jia, Guan-Hua (Jia, Guan-Hua.) | Wang, Rui-Jie (Wang, Rui-Jie.)

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EI Scopus PKU CSCD

Abstract:

A new multiaxial fatigue damage parameter applied to maximum amplitude of axial and circular strain is presented. The parameter which reflects the effect of loading paths, is convenient for application because it does not have any material constants. Considering the average stress of the axial and circular stress responses by different loading paths, a new multiaxial fatigue life prediction model is established by combining the multiaxial fatigue damage parameter with the Manson-Coffin equation. The errors between the predicted fatigue lives and multiaxial fatigue experimental results by testing four materials of GH4169 alloy, steel 45 and Inconel 718 steel and 304 stainless steel are within 2 factors.

Keyword:

Life cycle Strain Loading Components Fatigue testing Steel Forecasting Fatigue of materials Mathematical models

Author Community:

  • [ 1 ] [Sun, Guo-Qin]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100022, China
  • [ 2 ] [Shang, De-Guang]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100022, China
  • [ 3 ] [Ding, Lei]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100022, China
  • [ 4 ] [Deng, Jing]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100022, China
  • [ 5 ] [Jia, Guan-Hua]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100022, China
  • [ 6 ] [Wang, Rui-Jie]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100022, China

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Source :

Journal of Beijing University of Technology

ISSN: 0254-0037

Year: 2006

Issue: 8

Volume: 32

Page: 688-692

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 10

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