Method to measure cavity loss of LD - Details

Author：

Shu, Xiong-Wen (Shu, Xiong-Wen.) | Xu, Chen (Xu, Chen.) (Scholars：徐晨) | Tian, Zeng-Xia (Tian, Zeng-Xia.) | Shen, Guang-Di (Shen, Guang-Di.)

Indexed by：

EI Scopus PKU CSCD

Abstract：

A　new　method　was　put　forwards　to　measure　the　cavity　loss　of　LD.　By　depositing　high　reflection　layers　on　the　rear　facet　and　anti-reflection　layers　on　the　front　facet　of　the　LD,　and　using　the　linear　relation　between　1/ηe　and　1/In[1/RfRr]　(Rf　and　Rr　are　the　front　facet　and　rear　facet　reflection,　respectively),　the　method　eliminates　the　error　induced　by　using　the　usually　used　way.　It　makes　the　value　more　accurate　and　reduces　the　error　as　much　as　15%.

Keyword：

Deposition Diodes Errors Reflection Antireflection coatings Absorption Losses Quantum efficiency

Author Community：

[ 1 ] [Shu, Xiong-Wen]Beijing Opto-Electronic Technology Laboratory, School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China
[ 2 ] [Xu, Chen]Beijing Opto-Electronic Technology Laboratory, School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China
[ 3 ] [Tian, Zeng-Xia]Beijing Opto-Electronic Technology Laboratory, School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China
[ 4 ] [Shen, Guang-Di]Beijing Opto-Electronic Technology Laboratory, School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China

Reprint Author's Address：

Email：

xwshu@emails.bjut.edu.cn

Show more details

Related Keywords：

Process investigation of electron beam evaporation deposited amorphous silicon optical films
2006，Journal of Optoelectronics Laser
Laser micro-fabrication in RF MEMS switches
2009，2009 13th International Symposium on Antenna Technology and Applied Electromagnetics and the Canadian Radio Sciences Meeting, ANTEM/URSI 2009
Polymer assisted deposition of high-quality CsPbI2Br film with enhanced film thickness and stability
2020，Nano Research
Mass transfer properties of CdS modified TiO2 nanotube arrays electrodes
2012，Journal of Engineering Thermophysics

Source ：

Journal of Optoelectronics Laser

ISSN： 1005-0086

Year： 2006

Issue： 4

Volume： 17

Page： 455-457

Cited Count：

WoS CC Cited Count：

SCOPUS Cited Count：

ESI Highly Cited Papers on the List： 0 Unfold All

WanFang Cited Count：

Chinese Cited Count：

30 Days PV： 14

Affiliated Colleges：

信息科学技术学院本学院/部未明确归属的数据

Get Fulltext

Library Discovery Baidu Scholar Search Engineering Village

Type
Departments

All Years Choose Year From to