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Author:

Yuan, Yue (Yuan, Yue.) | Yu, Huiping (Yu, Huiping.) | Qin, Fei (Qin, Fei.) (Scholars:秦飞) | Yang, Liu (Yang, Liu.) | An, Tong (An, Tong.) | Chen, Pei (Chen, Pei.)

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EI Scopus

Abstract:

In order to solve the problem of cutting temperature measurement during the QFN cutting separation process, the infrared thermal imager is used to measure the QFN cutting temperature under different conditions, which include: with cutting fluid, without cutting fluid, and different cutting speed of 300/600/900 rpm. Temperature measuring results show: when without cutting fluid, temperature almost not influenced by cutting speed, EMC highest temperature basic maintain at 80°C, copper lead frame highest temperature at 127°C; When with cutting fluid, the highest temperature of EMC rise from 23°C to 35°C, the highest temperature of copper lead frame rise from 35°C to 40°C. The temperature of copper lead frame is higher than EMC. The simulation results show that the maximum stress of copper layer is greater than the EMC layer, joining cutting fluid can effectively reduce the stress value. © 2017 IEEE.

Keyword:

Electromagnetic compatibility Temperature measurement Electronics packaging Cutting Cutting fluids Thermography (imaging) Computer simulation

Author Community:

  • [ 1 ] [Yuan, Yue]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, China
  • [ 2 ] [Yu, Huiping]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, China
  • [ 3 ] [Qin, Fei]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, China
  • [ 4 ] [Yang, Liu]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, China
  • [ 5 ] [An, Tong]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, China
  • [ 6 ] [Chen, Pei]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, China

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Year: 2017

Page: 1073-1077

Language: English

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

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Chinese Cited Count:

30 Days PV: 5

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