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Author:

Shi, Huifeng (Shi, Huifeng.) | Liu, Xianqiang (Liu, Xianqiang.) | Wu, Rui (Wu, Rui.) | Zheng, Yijing (Zheng, Yijing.) | Li, Yonghe (Li, Yonghe.) | Cheng, Xiaopeng (Cheng, Xiaopeng.) | Pfleging, Wilhelm (Pfleging, Wilhelm.) | Zhang, Yuefei (Zhang, Yuefei.) (Scholars:张跃飞)

Indexed by:

Scopus SCIE

Abstract:

In situ scanning electron microscopy (SEM) offers a good way to investigate the structural evolution during lithiation and delithiation processes. In this paper, the dynamical morphological evolution of 3D-line-structured/unstructured Si/C composite electrodes was observed by in situ SEM. The investigation revealed the microstructural origin of large charge capacity for 3D-line-structured anodes. Based on this proposed mechanism, a coarse optimization of 3D-line-structured anodes was proposed. These results shed light on the unique advantages of using an in situ SEM technique when studying realistic bulk batteries and designing 3D electrode structures.

Keyword:

lithium-ion battery 3D structure Si/C composites in situ scanning electron microscopy (SEM)

Author Community:

  • [ 1 ] [Shi, Huifeng]Beijing Univ Technol, Inst Microstruct & Property Adv Mat, Beijing 100124, Peoples R China
  • [ 2 ] [Liu, Xianqiang]Beijing Univ Technol, Inst Microstruct & Property Adv Mat, Beijing 100124, Peoples R China
  • [ 3 ] [Wu, Rui]Beijing Univ Technol, Inst Microstruct & Property Adv Mat, Beijing 100124, Peoples R China
  • [ 4 ] [Li, Yonghe]Beijing Univ Technol, Inst Microstruct & Property Adv Mat, Beijing 100124, Peoples R China
  • [ 5 ] [Cheng, Xiaopeng]Beijing Univ Technol, Inst Microstruct & Property Adv Mat, Beijing 100124, Peoples R China
  • [ 6 ] [Zhang, Yuefei]Beijing Univ Technol, Inst Microstruct & Property Adv Mat, Beijing 100124, Peoples R China
  • [ 7 ] [Zheng, Yijing]Karlsruhe Inst Technol, Inst Appl Mat IAM AWP, D-76313 Karlsruhe, Germany
  • [ 8 ] [Pfleging, Wilhelm]Karlsruhe Inst Technol, Inst Appl Mat IAM AWP, D-76313 Karlsruhe, Germany
  • [ 9 ] [Pfleging, Wilhelm]KNMF, D-76344 Karlsruhe, Germany

Reprint Author's Address:

  • 张跃飞

    [Zhang, Yuefei]Beijing Univ Technol, Inst Microstruct & Property Adv Mat, Beijing 100124, Peoples R China;;[Pfleging, Wilhelm]Karlsruhe Inst Technol, Inst Appl Mat IAM AWP, D-76313 Karlsruhe, Germany;;[Pfleging, Wilhelm]KNMF, D-76344 Karlsruhe, Germany

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Source :

APPLIED SCIENCES-BASEL

Year: 2019

Issue: 5

Volume: 9

2 . 7 0 0

JCR@2022

ESI Discipline: ENGINEERING;

ESI HC Threshold:136

JCR Journal Grade:2

Cited Count:

WoS CC Cited Count: 18

SCOPUS Cited Count: 25

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 4

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