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Author:

Wang, Dayong (Wang, Dayong.) (Scholars:王大勇) | Zhao, Yanlin (Zhao, Yanlin.) | Rong, Lu (Rong, Lu.) (Scholars:戎路) | Wan, Min (Wan, Min.) | Shi, Xiaoyu (Shi, Xiaoyu.) | Wang, Yunxin (Wang, Yunxin.) (Scholars:王云新) | Sheridan, John T. (Sheridan, John T..)

Indexed by:

EI Scopus SCIE

Abstract:

Terahertz waves have unique propagation and penetration ability, and these reasons have been widely used in nondestructive testing. Compared with other terahertz imaging approaches, terahertz digital holography can retrieve both quantitative amplitude and phase information about an object wavefront in real time. A continuous-wave terahertz reflective digital holographic method is proposed for measuring the profile of covered objects. Subpixel image registration and image fusion algorithms are presented to expand the field-of-view (FOV) of the system. The validity of the proposed method is verified by the experiment using an optical pumped far-IR gas laser and a pyroelectric array detector. The profile of a metallic bookmark covered by a polytetrafluoroethylene plate is obtained. The FOV is expanded by a factor of 1.75 compared with that of a reconstruction performed employing single hologram. (C) 2019 Society of Photo-Optical Instrumentation Engineers (SPIE)

Keyword:

nondestructive testing terahertz imaging digital holography digital imaging processing

Author Community:

  • [ 1 ] [Wang, Dayong]Beijing Univ Technol, Coll Appl Sci, Beijing, Peoples R China
  • [ 2 ] [Zhao, Yanlin]Beijing Univ Technol, Coll Appl Sci, Beijing, Peoples R China
  • [ 3 ] [Rong, Lu]Beijing Univ Technol, Coll Appl Sci, Beijing, Peoples R China
  • [ 4 ] [Shi, Xiaoyu]Beijing Univ Technol, Coll Appl Sci, Beijing, Peoples R China
  • [ 5 ] [Wang, Yunxin]Beijing Univ Technol, Coll Appl Sci, Beijing, Peoples R China
  • [ 6 ] [Wang, Dayong]Beijing Engn Res Ctr Precis Measurement Technol &, Beijing, Peoples R China
  • [ 7 ] [Rong, Lu]Beijing Engn Res Ctr Precis Measurement Technol &, Beijing, Peoples R China
  • [ 8 ] [Wang, Yunxin]Beijing Engn Res Ctr Precis Measurement Technol &, Beijing, Peoples R China
  • [ 9 ] [Wan, Min]Univ Coll Dublin, Sch Elect & Elect Engn, Dublin 4, Ireland
  • [ 10 ] [Sheridan, John T.]Univ Coll Dublin, Sch Elect & Elect Engn, Dublin 4, Ireland

Reprint Author's Address:

  • 戎路

    [Rong, Lu]Beijing Univ Technol, Coll Appl Sci, Beijing, Peoples R China;;[Rong, Lu]Beijing Engn Res Ctr Precis Measurement Technol &, Beijing, Peoples R China

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Related Keywords:

Source :

OPTICAL ENGINEERING

ISSN: 0091-3286

Year: 2019

Issue: 2

Volume: 58

1 . 3 0 0

JCR@2022

ESI Discipline: ENGINEERING;

ESI HC Threshold:136

JCR Journal Grade:4

Cited Count:

WoS CC Cited Count: 18

SCOPUS Cited Count: 20

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 6

Affiliated Colleges:

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