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Author:

An, Tong (An, Tong.) | Qin, Fei (Qin, Fei.) (Scholars:秦飞)

Indexed by:

EI Scopus

Abstract:

The reliability of board level electronic package subjected to drop impact loadings is one of the most concerned issues. In this paper, a standard board level drop impact test was modeled as double cantilever beam model. The deflection and curvature of the Printed Circuit Board (PCB) and the component were compared with that derived from static analysis in order to understand the influence of dynamic response of the PCB on the solder joints. The results show that the difference of flexibility between the PCB and the package is the main driver for solder joint stress; the dynamic response of the PCB observably affects the stress in solder joints. ©2009 IEEE.

Keyword:

Dynamic response Electronics packaging Drops Cantilever beams Printed circuit boards Packaging

Author Community:

  • [ 1 ] [An, Tong]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, 100124, China
  • [ 2 ] [Qin, Fei]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, 100124, China

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Source :

Year: 2009

Page: 370-374

Language: English

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 1

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 6

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