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Abstract:
An approach for estimating the leakage power and the speed of the dual threshold domino OR gates based on Wavelet Neural Networks (WNN) in 45 nm technology is proposed. The estimating system has fast convergence and high precision. By studying the impact of the dual threshold voltage technique (DTV) on leakage reduction and delay increase, it successfully estimates the nonlinear changing of the leakage power and delay of the different inputs domino OR gates. At last, the reason for the estimating error and the trend of the estimating curve are explained, respectively. © 2009 Springer Berlin Heidelberg.
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ISSN: 0302-9743
Year: 2009
Issue: PART 1
Volume: 5551 LNCS
Page: 844-851
Language: English
Cited Count:
WoS CC Cited Count: 0
SCOPUS Cited Count:
ESI Highly Cited Papers on the List: 0 Unfold All
WanFang Cited Count:
Chinese Cited Count:
30 Days PV: 11
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