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Author:

Jin, Dong-Yue (Jin, Dong-Yue.) | Zhang, Wan-Rong (Zhang, Wan-Rong.) | Qiu, Jian-Jun (Qiu, Jian-Jun.) | Gao, Pan (Gao, Pan.)

Indexed by:

EI Scopus

Abstract:

Base on the thermal-electric feedback network analysis, the thermal stability factor S is presented to express the thermal stability of the device. It is shown that the self-heating effect is compensated completely and the electrical characteristic of device won't shift when S=0. Furthermore, the expression of the minimum ballasting resistance RC of HBT to compensate the self-heating effect is presented taking into account of the temperature dependence of emitter current, the valence-band discontinuity at emitter junction (ΔEV), the bandgap narrowing due to heavy doping (ΔEg), additional ballasting resistance in emitter and base (RB and RE)- It is found that the higher the temperature T is, the smaller the minimum ballasting resistance RC to compensate the self-heating effect is. The agreement between theory and experiment is shown to be excellent. Because of the reducing of ballasting resistance, RF power HBT will provide higher output power, power gain, and power-added efficiency (PAE) in an amplifier block. © 2006 IEEE.

Keyword:

Heterojunction bipolar transistors Heat resistance Thermodynamic stability Resistors Optimization Thermal effects Feedback control Electric properties

Author Community:

  • [ 1 ] [Jin, Dong-Yue]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China
  • [ 2 ] [Zhang, Wan-Rong]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China
  • [ 3 ] [Qiu, Jian-Jun]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China
  • [ 4 ] [Gao, Pan]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China

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Source :

Year: 2006

Page: 224-226

Language: English

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 2

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 8

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