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Author:

Liu, Hanli (Liu, Hanli.) | Sun, Zheng (Sun, Zheng.) | Tang, Dexian (Tang, Dexian.) | Huang, Hongye (Huang, Hongye.) | Kaneko, Tohru (Kaneko, Tohru.) | Chen, Zhijie (Chen, Zhijie.) | Deng, Wei (Deng, Wei.) | Wu, Rui (Wu, Rui.) | Okada, Kenichi (Okada, Kenichi.)

Indexed by:

EI Scopus SCIE

Abstract:

This paper presents a Bluetooth low-energy (BLE) transceiver (TRX) achieving ultra-low-power operation for Internet-of-Things (IoT) applications. The proposed TRX utilizes a wide-bandwidth low-power fractional-N digital phase-locked loop (DPLL) as a central component to perform multiple roles: a direct frequency modulator for the transmitter (TX), an analogto-digital converter (ADC) for the receiver (RX), a local oscillator for RX, and a frequency and phase synchronizer for the RX. The DPLL-based single-path downconversion method is adapted to halve the analog baseband circuit to further reduce the power consumption while maintaining a high interference rejection. A DPLL-based ADC with a digital-to-analog converter feedback greatly improves the ADC dynamic range, which improves the RX sensitivity and interference tolerance. By maximally reducing the required radio frequency and analog front-end components in RX, an RX power consumption of 2.3 mW is achieved with a -94 dBm sensitivity. The RX also satisfied all interference requirements with a certain margin. A 5.0-mW TX is achieved when delivering an output power of 0 dBm with a frequency-shift keying error of only 1.89%.

Keyword:

IIP3 low-noise amplifier (LNA) interference Bluetooth low energy (BLE) ADPLL digital-to-time converter (DTC) single-point modulation hybrid loop digital phase-locked loop (DPLL) fractional-N direct frequency-modulation (DFM) IIP2 PLL ultra-low power (ULP) time-to-digital converter (TDC) sensitivity direct frequency-modulation transceiver (TRX) blocker analog-to-digital converter (ADC) Gaussian frequency-shift keying (GFSK) delta sigma

Author Community:

  • [ 1 ] [Liu, Hanli]Tokyo Inst Technol, Dept Phys Elect, Tokyo 1528552, Japan
  • [ 2 ] [Sun, Zheng]Tokyo Inst Technol, Dept Phys Elect, Tokyo 1528552, Japan
  • [ 3 ] [Tang, Dexian]Tokyo Inst Technol, Dept Phys Elect, Tokyo 1528552, Japan
  • [ 4 ] [Huang, Hongye]Tokyo Inst Technol, Dept Phys Elect, Tokyo 1528552, Japan
  • [ 5 ] [Kaneko, Tohru]Tokyo Inst Technol, Dept Phys Elect, Tokyo 1528552, Japan
  • [ 6 ] [Okada, Kenichi]Tokyo Inst Technol, Dept Phys Elect, Tokyo 1528552, Japan
  • [ 7 ] [Chen, Zhijie]Beijing Univ Technol, Fac Informat, Beijing 100124, Peoples R China
  • [ 8 ] [Deng, Wei]Apple Inc, Cupertino, CA 95014 USA
  • [ 9 ] [Wu, Rui]Chinese Acad Sci, Inst Elect, Beijing 100190, Peoples R China

Reprint Author's Address:

  • [Liu, Hanli]Tokyo Inst Technol, Dept Phys Elect, Tokyo 1528552, Japan

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Source :

IEEE JOURNAL OF SOLID-STATE CIRCUITS

ISSN: 0018-9200

Year: 2018

Issue: 12

Volume: 53

Page: 3672-3687

5 . 4 0 0

JCR@2022

ESI Discipline: ENGINEERING;

ESI HC Threshold:156

JCR Journal Grade:1

Cited Count:

WoS CC Cited Count: 37

SCOPUS Cited Count: 42

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 3

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