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Author:

Deng, Wenjie (Deng, Wenjie.) | Chen, Yongfeng (Chen, Yongfeng.) | You, Congya (You, Congya.) | Liu, Beiyun (Liu, Beiyun.) | Yang, Yanhan (Yang, Yanhan.) | Shen, Gaoliang (Shen, Gaoliang.) | Li, Songyu (Li, Songyu.) | Sun, Ling (Sun, Ling.) | Zhang, Yongzhe (Zhang, Yongzhe.) (Scholars:张永哲) | Yan, Hui (Yan, Hui.)

Indexed by:

EI Scopus SCIE

Abstract:

2D material-based photodetectors have demonstrated the great potential in future optoelectric applications and the compatibility with the traditional semiconductor technology. However, low detectivity and difficulty of large-scale fabrication still limit their application. Here, an ultrasensitive in-plane lateral graphene-MoS2 heterostructure is successfully constructed using one-step growth by chemical vapor deposition, which is suitable for large-scale fabrication. The Schottky junction is formed in the channel with the edge contact of graphene and MoS2. It displays good rectification characteristics with an on/off ratio up to 10(6). As a photodetector, it exhibits excellent detectivity with the specific detectivity D* up to 1.4 x 10(14) Jones and the responsivity of 1.1 x 10(5) A W-1, which benefit from strong absorption, the efficient separation of the photoexcited carriers, and quick charge transport in the Schottky junction device. Moreover, heterostructure photodetector array is demonstrated here which shows the large-scale fabrication capacity. All of these results prove the potential of 2D material-based junction devices for optoelectronic devices.

Keyword:

photodetectors lateral heterostructures chemical vapor deposition MoS2 graphene

Author Community:

  • [ 1 ] [Deng, Wenjie]Beijing Univ Technol, Coll Mat Sci & Engn, Minist Educ China, Key Lab Adv Funct Mat, Beijing 100124, Peoples R China
  • [ 2 ] [Chen, Yongfeng]Beijing Univ Technol, Coll Mat Sci & Engn, Minist Educ China, Key Lab Adv Funct Mat, Beijing 100124, Peoples R China
  • [ 3 ] [You, Congya]Beijing Univ Technol, Coll Mat Sci & Engn, Minist Educ China, Key Lab Adv Funct Mat, Beijing 100124, Peoples R China
  • [ 4 ] [Liu, Beiyun]Beijing Univ Technol, Coll Mat Sci & Engn, Minist Educ China, Key Lab Adv Funct Mat, Beijing 100124, Peoples R China
  • [ 5 ] [Yang, Yanhan]Beijing Univ Technol, Coll Mat Sci & Engn, Minist Educ China, Key Lab Adv Funct Mat, Beijing 100124, Peoples R China
  • [ 6 ] [Shen, Gaoliang]Beijing Univ Technol, Coll Mat Sci & Engn, Minist Educ China, Key Lab Adv Funct Mat, Beijing 100124, Peoples R China
  • [ 7 ] [Li, Songyu]Beijing Univ Technol, Coll Mat Sci & Engn, Minist Educ China, Key Lab Adv Funct Mat, Beijing 100124, Peoples R China
  • [ 8 ] [Zhang, Yongzhe]Beijing Univ Technol, Coll Mat Sci & Engn, Minist Educ China, Key Lab Adv Funct Mat, Beijing 100124, Peoples R China
  • [ 9 ] [Yan, Hui]Beijing Univ Technol, Coll Mat Sci & Engn, Minist Educ China, Key Lab Adv Funct Mat, Beijing 100124, Peoples R China
  • [ 10 ] [Sun, Ling]Beijing Univ Technol, Beijing Guyue New Mat Res Inst, Beijing 100124, Peoples R China

Reprint Author's Address:

  • 张永哲

    [Zhang, Yongzhe]Beijing Univ Technol, Coll Mat Sci & Engn, Minist Educ China, Key Lab Adv Funct Mat, Beijing 100124, Peoples R China

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Source :

ADVANCED ELECTRONIC MATERIALS

ISSN: 2199-160X

Year: 2018

Issue: 9

Volume: 4

6 . 2 0 0

JCR@2022

ESI Discipline: MATERIALS SCIENCE;

ESI HC Threshold:260

JCR Journal Grade:1

Cited Count:

WoS CC Cited Count: 57

SCOPUS Cited Count: 60

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 9

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