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Author:

Wei, X. (Wei, X..) | Deng, J. (Deng, J..) | Xu, C. (Xu, C..) (Scholars:徐晨) | Miao, P. (Miao, P..) | Mao, M. (Mao, M..) | Li, J. (Li, J..) | Han, J. (Han, J..)

Indexed by:

Scopus PKU CSCD

Abstract:

For anti-resonant reflecting optical waveguide (ARROW) vertical-cavity surface-emitting laser (VCSEL), transfer matrix method in the cylindrical coordinates is used to analyze the lateral radiation losses of the fundamental mode and first mode with different thickness of the first clad. Compared with the traditional planar approximation method, this method can calculate the loss more precisely, and it shows the discipline of the losses with the thickness of the first clad more clearly. Furthermore, it is indicated that the best thickness of the first clad is not necessarily the value when the fundamental mode is resonant. And both the lateral radiation losses of the fundamental mode and first mode should be considered.

Keyword:

Anti-resonant reflecting optical waveguide (ARROW); Lasers; Lateral radiation losses; Transfer matrix method; Vertical-cavity surface-emitting laser (VCSEL)

Author Community:

  • [ 1 ] [Wei, X.]Laboratory of Opto-electronics Technology, Beijing University of Technology, Beijing 100022, China
  • [ 2 ] [Deng, J.]Laboratory of Opto-electronics Technology, Beijing University of Technology, Beijing 100022, China
  • [ 3 ] [Xu, C.]Laboratory of Opto-electronics Technology, Beijing University of Technology, Beijing 100022, China
  • [ 4 ] [Miao, P.]Laboratory of Opto-electronics Technology, Beijing University of Technology, Beijing 100022, China
  • [ 5 ] [Mao, M.]Laboratory of Opto-electronics Technology, Beijing University of Technology, Beijing 100022, China
  • [ 6 ] [Li, J.]Laboratory of Opto-electronics Technology, Beijing University of Technology, Beijing 100022, China
  • [ 7 ] [Han, J.]Laboratory of Opto-electronics Technology, Beijing University of Technology, Beijing 100022, China

Reprint Author's Address:

  • [Wei, X.]Laboratory of Opto-electronics Technology, Beijing University of Technology, Beijing 100022, China

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Source :

Semiconductor Optoelectronics

ISSN: 1001-5868

Year: 2011

Issue: 6

Volume: 32

Page: 769-772

Cited Count:

WoS CC Cited Count: 63

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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