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Author:

Lin, Jian (Lin, Jian.) | Ma, Ninshu (Ma, Ninshu.) | Lei, Yongping (Lei, Yongping.) (Scholars:雷永平) | Murakawa, Hidekazu (Murakawa, Hidekazu.)

Indexed by:

EI Scopus SCIE

Abstract:

The welding residual stress of lap joints of thin steel sheets was measured by the cos alpha X-ray diffraction method and compared with the numerical simulation. The longitudinal residual stress in the region near the weld is close to the yield strength of the base metal. The welding residual stress distribution is asymmetrical on the two plates and two sides of the weld because of the asymmetrical geometry of the lap joint. A higher residual stress was observed on the lower plate of lap joints. The longitudinal residual stress has almost the uniform distribution along the weld line except near two ends. The influencing length near two ends of the weld line is about 20-30 mm. The maximum tensile value of the longitudinal residual stress of the lap joint of the high strength steel TS590 is higher than that of the mild steel TS270. (C) 2016 Elsevier B.V. All rights reserved.

Keyword:

Residual stress Numerical simulation X-ray diffraction measurement method Lap joints Arc welding

Author Community:

  • [ 1 ] [Lin, Jian]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing 700124, Peoples R China
  • [ 2 ] [Lei, Yongping]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing 700124, Peoples R China
  • [ 3 ] [Ma, Ninshu]Osaka Univ, Joining & Welding Res Inst, Osaka 5670047, Japan
  • [ 4 ] [Murakawa, Hidekazu]Osaka Univ, Joining & Welding Res Inst, Osaka 5670047, Japan

Reprint Author's Address:

  • [Lin, Jian]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing 700124, Peoples R China

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Source :

JOURNAL OF MATERIALS PROCESSING TECHNOLOGY

ISSN: 0924-0136

Year: 2017

Volume: 243

Page: 387-394

6 . 3 0 0

JCR@2022

ESI Discipline: MATERIALS SCIENCE;

ESI HC Threshold:287

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count: 139

SCOPUS Cited Count: 149

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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