Using　Wavelet　Neural　Networks　(WNN),　low　power　domino　circuit　performance　statistical　characterization　is　investigated　in　this　paper.　The　proposed　model　successfully　estimates　the　nonlinear　changing　of　the　leakage　power,　the　active　power,　and　the　delay　of　the　different　fanin　low　power　domino　gates　with　the　dual　threshold　voltage　technique　(DVT),　the　multiple-supply　technique　(MST),　and　the　sleep　transistor　technique　(SST).　At　last,　the　precision　priority　of　estimating　system　is　obtained,　and　process　and　temperature　variation　effect　on　estimation　errors　is　analyzed.