• Complex
  • Title
  • Keyword
  • Abstract
  • Scholars
  • Journal
  • ISSN
  • Conference
搜索

Author:

Qin, Fei (Qin, Fei.) (Scholars:秦飞) | Hu, Yuankun (Hu, Yuankun.) | Dai, Yanwei (Dai, Yanwei.) (Scholars:代岩伟) | An, Tong (An, Tong.) | Chen, Pei (Chen, Pei.) | Gong, Yanpeng (Gong, Yanpeng.) | Yu, Huiping (Yu, Huiping.)

Indexed by:

EI Scopus SCIE

Abstract:

Characterizations of equivalent thermal conductivity (ETC) of sintered silver is an important topic due to the thermal-mechanical reliability requirements of electronic packaging. In this paper, the effect of various types of cracks on the ETC of sintered silver are discussed. A numerical method to simulate the heat transfer behaviors of porous sintered silver containing the crack effect is presented. The results show that the ETC of sintered silver depends significantly on the crack length, crack orientation, porosity, and pore shape. Theoretical formulae to estimate the ETC of sintered silver are also presented, in which the effects of arbitrary crack depth, arbitrary crack orientation, arbitrary porosity, and arbitrary pore shape factor on ETC are included. It has been found that the influence of the side edge crack on the reduction of the ETC of sintered silver is the most obvious compared with the center crack and the upper edge crack. This study presents a quantitative method to evaluate the crack effect on the ETC of porous sintered silver.

Keyword:

crack effect Equivalent thermal conductivity numerical computation sintered silver porosity

Author Community:

  • [ 1 ] [Qin, Fei]Beijing Univ Technol, Inst Elect Packaging Technol & Reliabil, Coll Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China
  • [ 2 ] [Hu, Yuankun]Beijing Univ Technol, Inst Elect Packaging Technol & Reliabil, Coll Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China
  • [ 3 ] [Dai, Yanwei]Beijing Univ Technol, Inst Elect Packaging Technol & Reliabil, Coll Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China
  • [ 4 ] [An, Tong]Beijing Univ Technol, Inst Elect Packaging Technol & Reliabil, Coll Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China
  • [ 5 ] [Chen, Pei]Beijing Univ Technol, Inst Elect Packaging Technol & Reliabil, Coll Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China
  • [ 6 ] [Gong, Yanpeng]Beijing Univ Technol, Inst Elect Packaging Technol & Reliabil, Coll Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China
  • [ 7 ] [Yu, Huiping]Beijing Univ Technol, Inst Elect Packaging Technol & Reliabil, Coll Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China
  • [ 8 ] [Qin, Fei]Beijing Univ Technol, Beijing Key Lab Adv Mfg Technol, Beijing 100124, Peoples R China
  • [ 9 ] [Dai, Yanwei]Beijing Univ Technol, Beijing Key Lab Adv Mfg Technol, Beijing 100124, Peoples R China
  • [ 10 ] [An, Tong]Beijing Univ Technol, Beijing Key Lab Adv Mfg Technol, Beijing 100124, Peoples R China
  • [ 11 ] [Chen, Pei]Beijing Univ Technol, Beijing Key Lab Adv Mfg Technol, Beijing 100124, Peoples R China
  • [ 12 ] [Gong, Yanpeng]Beijing Univ Technol, Beijing Key Lab Adv Mfg Technol, Beijing 100124, Peoples R China

Reprint Author's Address:

  • 代岩伟

    [Dai, Yanwei]Beijing Univ Technol, Inst Elect Packaging Technol & Reliabil, Coll Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China;;[Dai, Yanwei]Beijing Univ Technol, Beijing Key Lab Adv Mfg Technol, Beijing 100124, Peoples R China

Show more details

Related Keywords:

Related Article:

Source :

JOURNAL OF ELECTRONIC MATERIALS

ISSN: 0361-5235

Year: 2020

Issue: 10

Volume: 49

Page: 5994-6008

2 . 1 0 0

JCR@2022

ESI Discipline: MATERIALS SCIENCE;

ESI HC Threshold:169

Cited Count:

WoS CC Cited Count: 12

SCOPUS Cited Count: 15

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 7

Online/Total:788/10671059
Address:BJUT Library(100 Pingleyuan,Chaoyang District,Beijing 100124, China Post Code:100124) Contact Us:010-67392185
Copyright:BJUT Library Technical Support:Beijing Aegean Software Co., Ltd.