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Author:

Han, Xiaodong (Han, Xiaodong.) (Scholars:韩晓东) | Wang, Lihua (Wang, Lihua.) (Scholars:王立华) | Liu, Pan (Liu, Pan.) | Yue, Yonghai (Yue, Yonghai.) | Yang, Mingjie (Yang, Mingjie.) | Sun, Jialin (Sun, Jialin.) | Zhang, Ze (Zhang, Ze.)

Indexed by:

CPCI-S EI Scopus

Abstract:

Using our recently developed in situ transmission electron microscopy techniques, we revealed that the FCC structured Ni nanowires with diameter of about 30 nm possess ultra-large strain plasticity. Dynamic complex dislocation activities mediated the large strain bent-plasticity and they were monitored at atomic scale in real time. The bent-induced strain gradient allows studying the strain effects on dislocation mediated plasticity. We also explored the deformation techniques to more general cases, the nano thin films. An example of tensile Pt ultra-thin film is presented.

Keyword:

nanowires dislocations ultra-thin nano films mechanical properties Dynamic atomic mechanisms

Author Community:

  • [ 1 ] [Han, Xiaodong]Beijing Univ Technol, Inst Microstruct & Property Adv Mat, Beijing 100124, Peoples R China
  • [ 2 ] [Wang, Lihua]Beijing Univ Technol, Inst Microstruct & Property Adv Mat, Beijing 100124, Peoples R China
  • [ 3 ] [Liu, Pan]Beijing Univ Technol, Inst Microstruct & Property Adv Mat, Beijing 100124, Peoples R China
  • [ 4 ] [Yue, Yonghai]Beijing Univ Technol, Inst Microstruct & Property Adv Mat, Beijing 100124, Peoples R China
  • [ 5 ] [Zhang, Ze]Beijing Univ Technol, Inst Microstruct & Property Adv Mat, Beijing 100124, Peoples R China
  • [ 6 ] [Zhang, Ze]Zhejiang Univ, Ctr Electron Microscopy, Dept Mat Sci, Zhejiang, Peoples R China
  • [ 7 ] [Yang, Mingjie]Tsinghua Univ, Mol Nanosci Educ Minist, Dept Key Lab Atomic, Beijing 100084, Peoples R China
  • [ 8 ] [Sun, Jialin]Tsinghua Univ, Mol Nanosci Educ Minist, Dept Key Lab Atomic, Beijing 100084, Peoples R China

Reprint Author's Address:

  • 韩晓东

    [Han, Xiaodong]Beijing Univ Technol, Inst Microstruct & Property Adv Mat, Beijing 100124, Peoples R China

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Source :

PRICM 7, PTS 1-3

ISSN: 0255-5476

Year: 2010

Volume: 654-656

Page: 2293-,

Language: English

Cited Count:

WoS CC Cited Count: 5

SCOPUS Cited Count: 8

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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