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Author:

Zhou, Shaoxin (Zhou, Shaoxin.) | Yang, Jiancan (Yang, Jiancan.) | Zhang, Yingchao (Zhang, Yingchao.) | Zhang, Peng (Zhang, Peng.) | Nie, Zuoren (Nie, Zuoren.)

Indexed by:

EI Scopus SCIE

Abstract:

Tungsten has poor processing performance and its brittleness often leads to defects. The effect of grain size on rotary swaging of the sintered rod was investigated to improve the quality of the destination part. Three different grain sizes of sintered rods were selected to research the physical and mechanical properties, microstructure, and texture. The texture evolution of the sintered rods and the effect of qualification rate of destination parts were studied. It was found that the {111} uvw uvw 110 110 uvw texture formed in the sintered process was not beneficial to ductility. The increment of grain size has advantages for the processing technology within a certain range. (c) 2021 The Authors. Published by Elsevier B.V. This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/).

Keyword:

Grain size Electron backscattering diffraction Texture Tungsten (EBSD)

Author Community:

  • [ 1 ] [Zhou, Shaoxin]Beijing Univ Technol, Minist Educ China, Key Lab Adv Funct Mat, Fac Mat & Mfg, Beijing 100124, Peoples R China
  • [ 2 ] [Yang, Jiancan]Beijing Univ Technol, Minist Educ China, Key Lab Adv Funct Mat, Fac Mat & Mfg, Beijing 100124, Peoples R China
  • [ 3 ] [Zhang, Yingchao]Beijing Univ Technol, Minist Educ China, Key Lab Adv Funct Mat, Fac Mat & Mfg, Beijing 100124, Peoples R China
  • [ 4 ] [Zhang, Peng]Beijing Univ Technol, Minist Educ China, Key Lab Adv Funct Mat, Fac Mat & Mfg, Beijing 100124, Peoples R China
  • [ 5 ] [Nie, Zuoren]Beijing Univ Technol, Minist Educ China, Key Lab Adv Funct Mat, Fac Mat & Mfg, Beijing 100124, Peoples R China

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Source :

JOURNAL OF MATERIALS RESEARCH AND TECHNOLOGY-JMR&T

ISSN: 2238-7854

Year: 2021

Volume: 15

Page: 6434-6441

6 . 4 0 0

JCR@2022

JCR Journal Grade:1

Cited Count:

WoS CC Cited Count: 1

SCOPUS Cited Count: 1

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 5

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