• Complex
  • Title
  • Keyword
  • Abstract
  • Scholars
  • Journal
  • ISSN
  • Conference
搜索

Author:

Zhou, Yinqi (Zhou, Yinqi.) | Feng, Shiwei (Feng, Shiwei.) | You, Binyu (You, Binyu.) | Lv, Xianliang (Lv, Xianliang.) | Wang, Yaning (Wang, Yaning.) | Zhang, Boyang (Zhang, Boyang.)

Indexed by:

EI

Abstract:

With the continuous development of chip technology integration, chip heating and power consumption has become a serious problem affecting the system reliability. The chip junction temperature monitoring and increase in power consumption have become very important especially for the DSP chips with low power meter requirements. In this paper, a new measurement method for junction temperature and power consumption of DSP devices is designed based on the CCS platform. It can realize the realtime and accurate monitoring of chip junction temperature and power consumption. A variety of feasibility tests were carried out by varying its temperature stress and the load condition of the MSP430FR5969 chip. The test condition was calibrated and verified with Energy Trace technology, and the power consumption and junction temperature curves under different load conditions were obtained along with the temperature boundary. This method provides an important reference for the reliability research and low power design of DSP chip. © 2023 IEEE.

Keyword:

Junction temperature Reliability Electric power utilization Digital signal processing Electric power supplies to apparatus

Author Community:

  • [ 1 ] [Zhou, Yinqi]Beijing University of Technology, Chaoyang District, Beijing, China
  • [ 2 ] [Feng, Shiwei]Beijing University of Technology, Chaoyang District, Beijing, China
  • [ 3 ] [You, Binyu]Beijing University of Technology, Chaoyang District, Beijing, China
  • [ 4 ] [Lv, Xianliang]China Electronics Standardization Institute, China
  • [ 5 ] [Wang, Yaning]Beijing University of Technology, Chaoyang District, Beijing, China
  • [ 6 ] [Zhang, Boyang]Beijing University of Technology, Chaoyang District, Beijing, China

Reprint Author's Address:

Email:

Show more details

Related Keywords:

Source :

Year: 2023

Page: 866-870

Language: English

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 5

Affiliated Colleges:

Online/Total:717/10696480
Address:BJUT Library(100 Pingleyuan,Chaoyang District,Beijing 100124, China Post Code:100124) Contact Us:010-67392185
Copyright:BJUT Library Technical Support:Beijing Aegean Software Co., Ltd.