In　order　to　fabricate　biaxial　textured　La2Zr2O7(LZO)　buffer　layers　of　high　quality　for　coated　conductors,　the　results　of　LZO　buffers　on　cube　textured　Ni-5at%W　(Ni5W)　substrates　were　obtained　by　chemical　solution　deposition　(CSD)　using　the　acetylacetone　lanthanum　and　the　acetylacetone　zirconium　as　precursor　salts,　and　the　propionic　acid　as　a　solvent.　After　the　rapid　one-step　heat　treatment　processes,　LZO　seed　layer　and　two　layers　of　LZO　films　were　prepared　on　the　cubic　textured　Ni5W　substrate　via　CSD　method.　It　was　found　that　the　deposited　LZO　film　with　seed　layer　derived　from　0.06　mol/L　concentration　of　solution　has　a　sharp　cubic　biaxial　texture.　The　values　of　full　width　at　half　maximum　(FWHM)　of　(222)　Phi　scan　and　(400)　rocking　curve　of　the　as-obtained　LZO　thick　film　are　6.37°　and　5.82°,　respectively.　The　SEM　images　reveal　that　the　surface　of　the　LZO　buffer　layer　is　smooth,　homogenous　and　free-crack.　Besides,　the　thickness　of　the　buffer　layers　is　about　120　nm.　All　the　results　show　that　this　LZO　film　can　be　used　as　a　buffer　layer　for　the　further　deposition　of　YBCO　film　on　it.