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Author:

Yang, Mengke (Yang, Mengke.) | Qin, Fei (Qin, Fei.) (Scholars:秦飞) | Yu, Daquan (Yu, Daquan.)

Indexed by:

EI Scopus

Abstract:

As the increasing of the chip integration and adoption of large-size wafers, the warpage problem is more serious in WLCSP. Considering that the die size becomes smaller, a full finite-element model with small die-size is difficult to develop. In this paper, a quarter model and a half general plane deformation (GPD) slice model were developed through finite element method (FEM). Their warpage and stress results were compared. Influences of different material and structural parameters in molding process were investigated finally. © 2018 IEEE.

Keyword:

Finite element method Molding Electronics packaging

Author Community:

  • [ 1 ] [Yang, Mengke]Institute of Electronics Packaging Technology and Reliability, College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, China
  • [ 2 ] [Qin, Fei]Institute of Electronics Packaging Technology and Reliability, College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, China
  • [ 3 ] [Yu, Daquan]Huatian Technology (Kunshan) Electronics, Kunshan, China

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Source :

Year: 2018

Page: 886-890

Language: English

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 3

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 4

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