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Abstract:
As the increasing of the chip integration and adoption of large-size wafers, the warpage problem is more serious in WLCSP. Considering that the die size becomes smaller, a full finite-element model with small die-size is difficult to develop. In this paper, a quarter model and a half general plane deformation (GPD) slice model were developed through finite element method (FEM). Their warpage and stress results were compared. Influences of different material and structural parameters in molding process were investigated finally. © 2018 IEEE.
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Year: 2018
Page: 886-890
Language: English
Cited Count:
WoS CC Cited Count: 0
SCOPUS Cited Count: 3
ESI Highly Cited Papers on the List: 0 Unfold All
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Chinese Cited Count:
30 Days PV: 4
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