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Author:

Fu, Jingyan (Fu, Jingyan.) | Hou, Ligang (Hou, Ligang.) | Lu, Bo (Lu, Bo.) | Wang, Jinhui (Wang, Jinhui.)

Indexed by:

EI Scopus

Abstract:

The study on thermal problem of through silicon via has become an important part of the three dimensional integrated circuit. This paper proposes some thermal aware optimization measures of TSV to optimize thermal performance of 3D IC. Thermal performance simulations on different TSV distribution, different TSV structure parameter and different TSV cluster are done respectively. Through the simulation and analysis, qualitative, quantitative results and thermal optimization measures are presented. According to the result, optimization could be done in EDA software. © 2014 IEEE.

Keyword:

Timing circuits Three dimensional integrated circuits Thermoanalysis Integrated circuit interconnects Silicon Electronics packaging

Author Community:

  • [ 1 ] [Fu, Jingyan]Beijing University of Technology, Beijing; 100124, China
  • [ 2 ] [Hou, Ligang]Beijing University of Technology, Beijing; 100124, China
  • [ 3 ] [Lu, Bo]Beijing University of Technology, Beijing; 100124, China
  • [ 4 ] [Wang, Jinhui]Beijing University of Technology, Beijing; 100124, China

Reprint Author's Address:

  • [hou, ligang]beijing university of technology, beijing; 100124, china

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Source :

Year: 2014

Language: English

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 5

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 8

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