Quick screen of thermal resistance for batching high brightness LEDs - Details

Author：

Li, Jingwan (Li, Jingwan.) | Feng, Shiwei (Feng, Shiwei.) (Scholars：冯士维) | Zhang, Guangchen (Zhang, Guangchen.) | Zhou, Zhou (Zhou, Zhou.) | Guo, Chunsheng (Guo, Chunsheng.)

Indexed by：

EI Scopus

Abstract：

This　paper　presents　a　method　of　quick　thermal　resistance　screen　for　batching　high　brightness　LEDs.　The　thermal　resistance　distribution　is　obtained　by　the　screen　instrument　using　temperature　sensitive　parameter　(TSP)　method.　By　comparing　the　measurement　results　of　initial　samples　and　the　screened　samples　with　unqualified　products　discarded,　both　the　expectation　and　the　variance　decrease.　Therefore,　the　uniformity　and　reliability　are　enhanced　through　screening.　In　the　application　of　LED　array　system,　the　total　lifetime　of　the　array　and　the　reliability　will　be　improved　highly　by　this　method.　This　study　provides　practical　principle　and　reference　value　in　the　production　and　application　of　batching　high　brightness　LEDs.　©　2012　IEEE.

Keyword：

Light emitting diodes Luminance Heat resistance

Author Community：

[ 1 ] [Li, Jingwan]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing, China
[ 2 ] [Feng, Shiwei]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing, China
[ 3 ] [Zhang, Guangchen]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing, China
[ 4 ] [Zhou, Zhou]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing, China
[ 5 ] [Guo, Chunsheng]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing, China