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Author:

Zhang, Guangchen (Zhang, Guangchen.) | Feng, Shiwei (Feng, Shiwei.) (Scholars:冯士维) | Wang, Lu (Wang, Lu.) | Xie, Xuesong (Xie, Xuesong.) | Gao, Lichao (Gao, Lichao.) | Meng, Haijie (Meng, Haijie.)

Indexed by:

EI Scopus

Abstract:

The reliability of power LEDs has strong dependence on successful package thermal management. In this paper, heating response curves of LEDs were recorded by the temperature sensitive parameter (TSP) method and fast-switching circuit techniques. It provided a novel method to analyze thermal resistance composition of power LED's packaging. Cover-and-block method was presented to provide a correction to the apparent thermal resistance of optical devices, and an electrical method to obtain radiant efficiency was also put forward. © 2008 IEEE.

Keyword:

Light emitting diodes Heat resistance Reliability Efficiency Integrated circuits

Author Community:

  • [ 1 ] [Zhang, Guangchen]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 2 ] [Feng, Shiwei]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 3 ] [Wang, Lu]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 4 ] [Xie, Xuesong]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 5 ] [Gao, Lichao]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 6 ] [Meng, Haijie]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China

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Source :

Year: 2008

Page: 1211-1214

Language: English

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 4

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 6

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