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Author:

Gao, Cha (Gao, Cha.) | Qin, Fei (Qin, Fei.) (Scholars:秦飞) | Zhu, Wenhui (Zhu, Wenhui.) | Xia, Guofeng (Xia, Guofeng.) | Ma, Xiaobo (Ma, Xiaobo.)

Indexed by:

EI Scopus

Abstract:

Thermal management for package assembly, especially for high power packages, is very important to the reliability and quality of electrical products. In this paper, a finite element approach is proposed to investigate the thermal performance of TO252-5L(B) package attached on printed circuit board(PCB) with different layers and sizes, which is further related to reliability issue of this type of IC package. © 2012 IEEE.

Keyword:

Printed circuit boards Finite element method Design of experiments Electronics packaging Heat resistance Packaging

Author Community:

  • [ 1 ] [Gao, Cha]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, 100124, China
  • [ 2 ] [Qin, Fei]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, 100124, China
  • [ 3 ] [Zhu, Wenhui]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, 100124, China
  • [ 4 ] [Zhu, Wenhui]Packaging Technology Research Institute, Tian Shui Hua Tian Technology CO., Ltd, Tian Shui Hua Tian, 741000, China
  • [ 5 ] [Xia, Guofeng]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, 100124, China
  • [ 6 ] [Ma, Xiaobo]Packaging Technology Research Institute, Tian Shui Hua Tian Technology CO., Ltd, Tian Shui Hua Tian, 741000, China

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Year: 2012

Page: 611-615

Language: English

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 5

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 6

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