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Author:

Tong, An (Tong, An.) | Fei, Qin (Fei, Qin.) (Scholars:秦飞)

Indexed by:

EI Scopus

Abstract:

Solder joints serve as mechanical, thermal and electrical interconnections between the electronic packages and the printed circuit board (PCB). Fracture of the solder joint is the most common failure mechanism in microsystem packages due to mechanical loads. In order to satisfy the demand for understanding the process of solder joint fracture, there is a need for a validated model, which is simple, reliable, and able to clarify of physics-of-failure of solder joint for design improvement. In this paper, the lattice model has been established to simulate the process of solder joint fracturing. The results show that the proposed lattice model can easily be used to predict the cracking of solder joint under tensile loading. The predicted crack pattern agrees well with that observed in experiments. ©2007 IEEE.

Keyword:

Printed circuit boards Soldered joints Packaging Cracks Crystal lattices Fracture Electronics packaging

Author Community:

  • [ 1 ] [Tong, An]School of Mechanical Engineering and Applied Electronic Technology, Beijing University of Technology, Beijing 100022, China
  • [ 2 ] [Fei, Qin]School of Mechanical Engineering and Applied Electronic Technology, Beijing University of Technology, Beijing 100022, China

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Year: 2007

Language: English

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 4

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