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Author:

Chen, Runze (Chen, Runze.) | Wang, Lixin (Wang, Lixin.) | Zhang, Hongkai (Zhang, Hongkai.) | Cui, Mengyao (Cui, Mengyao.) | Guo, Min (Guo, Min.)

Indexed by:

Scopus SCIE

Abstract:

Featured Application The split gate resurf stepped oxide with highly doped epitaxial layer (HDSGRSO) UMOSFET has extremely low on-state resistance, therefore, it can be used in synchronous rectification circuits to replace rectifier diodes to reduce rectification losses. It can greatly improve the efficiency of the DC/DC converter and there is no deadtime voltage caused by the Schottky barrier voltage. On the other hand, it can be applied to the high frequency switching due to its excellent dynamic characteristics. The split gate resurf stepped oxide with highly doped epitaxial layer (HDSGRSO) UMOSFET has been proposed. The epitaxial layer of HDSGRSO u-shape metal oxide semiconductor field effect transistor (UMOSFET) has been divided into three parts: the upper epitaxial layer, the lower epitaxial layer and the middle epitaxial layer with higher doping concentration. The research shows that the reduced SURface field (RESURF) active has been enhanced due to the high doped epitaxial layer, which can modulate the electric field distribution and reduce the internal high electric field. Therefore, the HDGRSO UMOSFET has a higher breakdown voltage (BV), a lower on-state specific resistance (R-SP) and a better figure of merit (FOM). According to the results of Technology Computer Aided Design (TCAD) simulations, the FOM (BV2/R-SP) of HDSGRSO UMOSFET has been improved by 464%, and FOM (R-SP x Q(gd)) of HDSGRSO UMOSFET has been reduced by 27.9% compared to the conventional structure, respectively, when the BV is 240 V. Furthermore, there is no extra special process required in this advanced fabrication procedure, which is relatively cost-effective and achievable.

Keyword:

FOM UMOSFET split gate electric field modulation high doped epitaxial layer

Author Community:

  • [ 1 ] [Chen, Runze]Chinese Acad Sci, Inst Microelect, Beijing 100029, Peoples R China
  • [ 2 ] [Wang, Lixin]Chinese Acad Sci, Inst Microelect, Beijing 100029, Peoples R China
  • [ 3 ] [Zhang, Hongkai]Chinese Acad Sci, Inst Microelect, Beijing 100029, Peoples R China
  • [ 4 ] [Cui, Mengyao]Chinese Acad Sci, Inst Microelect, Beijing 100029, Peoples R China
  • [ 5 ] [Guo, Min]Chinese Acad Sci, Inst Microelect, Beijing 100029, Peoples R China
  • [ 6 ] [Chen, Runze]Univ Chinese Acad Sci, Sch Microelect, Beijing 100049, Peoples R China
  • [ 7 ] [Wang, Lixin]Univ Chinese Acad Sci, Sch Microelect, Beijing 100049, Peoples R China
  • [ 8 ] [Zhang, Hongkai]Univ Chinese Acad Sci, Sch Microelect, Beijing 100049, Peoples R China
  • [ 9 ] [Guo, Min]Beijing Univ Technol, Coll Elect Sci & Technol, Fac Informat Technol, Beijing 100124, Peoples R China

Reprint Author's Address:

  • [Wang, Lixin]Chinese Acad Sci, Inst Microelect, Beijing 100029, Peoples R China;;[Wang, Lixin]Univ Chinese Acad Sci, Sch Microelect, Beijing 100049, Peoples R China

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Source :

APPLIED SCIENCES-BASEL

Year: 2020

Issue: 21

Volume: 10

2 . 7 0 0

JCR@2022

ESI Discipline: ENGINEERING;

ESI HC Threshold:115

Cited Count:

WoS CC Cited Count: 1

SCOPUS Cited Count: 1

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 7

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