Indexed by:
Abstract:
Electron field emissions from two well contrasted phase microstructures of magnetron-sputtered boron nitride (BN) films on Si (100) substrate, characterized by the Fourier transform infrared (FTIR) spectroscopy, were thoroughly investigated in this work. Compared with a mediocre turn-on field of about 18 V/mu m for the field emission from a pure hexagonal boron nitride (h-BN) film, a remarkably low turn-on field of about 5 V/mu m as well as excellent emission current density has been observed stably from a highly cubic boron nitride (c-BN) film. Aside from the geometric field enhancement, the excellent field emission properties of high cubic phase BN may originate from the assisting of c-BN phase with intrinsically negative electron affinity (NEA) and the special SP3 bonding of c-BN. (c) 2006 Elsevier B.V. All rights reserved.
Keyword:
Reprint Author's Address:
Email:
Source :
JOURNAL OF CRYSTAL GROWTH
ISSN: 0022-0248
Year: 2006
Issue: 1
Volume: 291
Page: 18-21
1 . 8 0 0
JCR@2022
ESI Discipline: CHEMISTRY;
JCR Journal Grade:2
Cited Count:
WoS CC Cited Count: 9
SCOPUS Cited Count: 11
ESI Highly Cited Papers on the List: 0 Unfold All
WanFang Cited Count:
Chinese Cited Count:
30 Days PV: 3
Affiliated Colleges: