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Author:

Wang, R. Z. (Wang, R. Z..) (Scholars:王如志) | Zhou, H. (Zhou, H..) | Song, X. M. (Song, X. M..) | Wang, B. (Wang, B..) (Scholars:王波) | Wang, H. (Wang, H..) | Yan, H. (Yan, H..)

Indexed by:

EI Scopus SCIE

Abstract:

Electron field emissions from two well contrasted phase microstructures of magnetron-sputtered boron nitride (BN) films on Si (100) substrate, characterized by the Fourier transform infrared (FTIR) spectroscopy, were thoroughly investigated in this work. Compared with a mediocre turn-on field of about 18 V/mu m for the field emission from a pure hexagonal boron nitride (h-BN) film, a remarkably low turn-on field of about 5 V/mu m as well as excellent emission current density has been observed stably from a highly cubic boron nitride (c-BN) film. Aside from the geometric field enhancement, the excellent field emission properties of high cubic phase BN may originate from the assisting of c-BN phase with intrinsically negative electron affinity (NEA) and the special SP3 bonding of c-BN. (c) 2006 Elsevier B.V. All rights reserved.

Keyword:

cubic phase films field emission boron nitride

Author Community:

  • [ 1 ] Beijing Univ Technol, Coll Mat Sci & Engn, Lab Thin Film Mat, Beijing 100022, Peoples R China
  • [ 2 ] Univ Vermont, Dept Phys, Burlington, VT 05405 USA

Reprint Author's Address:

  • 王波

    [Wang, B.]Beijing Univ Technol, Coll Mat Sci & Engn, Lab Thin Film Mat, Beijing 100022, Peoples R China

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Source :

JOURNAL OF CRYSTAL GROWTH

ISSN: 0022-0248

Year: 2006

Issue: 1

Volume: 291

Page: 18-21

1 . 8 0 0

JCR@2022

ESI Discipline: CHEMISTRY;

JCR Journal Grade:2

Cited Count:

WoS CC Cited Count: 9

SCOPUS Cited Count: 11

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 3

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