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Author:

Yuan Yue (Yuan Yue.) | Yu Huiping (Yu Huiping.) | Qin Fei (Qin Fei.) (Scholars:秦飞) | Yang Liu (Yang Liu.) | An Tong (An Tong.) | Chen Pei (Chen Pei.)

Indexed by:

CPCI-S

Abstract:

In order to solve the problem of cutting temperature measurement during the QFN cutting separation process, the infrared thermal imager is used to measure the QFN cutting temperature under different conditions, which include: with cutting fluid, without cutting fluid, and different cutting speed of 300/600/900 rpm. Temperature measuring results show: when without cutting fluid, temperature almost not influenced by cutting speed, EMC highest temperature basic maintain at 80 degrees C, copper lead frame highest temperature at 127 degrees C; When with cutting fluid, the highest temperature of EMC rise from 23 degrees C to 35 degrees C, the highest temperature of copper lead frame rise from 35 degrees C to 40 degrees C. The temperature of copper lead frame is higher than EMC. The simulation results show that the maximum stress of copper layer is greater than the EMC layer, joining cutting fluid can effectively reduce the stress value.

Keyword:

Infrared thermography QFN Numerical simulation Cutting temperature

Author Community:

  • [ 1 ] [Yuan Yue]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing, Peoples R China
  • [ 2 ] [Yu Huiping]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing, Peoples R China
  • [ 3 ] [Qin Fei]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing, Peoples R China
  • [ 4 ] [Yang Liu]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing, Peoples R China
  • [ 5 ] [An Tong]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing, Peoples R China
  • [ 6 ] [Chen Pei]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing, Peoples R China

Reprint Author's Address:

  • [Yu Huiping]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing, Peoples R China

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Source :

2017 18TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT)

Year: 2017

Page: 1073-1077

Language: English

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 6

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