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Author:

Jiang, Q. (Jiang, Q..) | Meng, J. (Meng, J..) | Shi, Y. (Shi, Y..) | Yin, Z. (Yin, Z..) | Chen, J. (Chen, J..) | Zhang, J. (Zhang, J..) | Wu, J. (Wu, J..) | Zhang, X. (Zhang, X..)

Indexed by:

EI Scopus

Abstract:

The behavior of H in β-Ga2O3 is of substantial interest because it is a common residual impurity that is present in β-Ga2O3, regardless of the synthesis methods. Herein, we report the influences of H-plasma exposure on the electric and optical properties of the heteroepitaxial β-Ga2O3 thin films grown on sapphire substrates by chemical vapor deposition. The results indicate that the H incorporation leads to a significantly increased electrical conductivity, a greatly reduced defect-related photoluminescence emission, and a slightly enhanced transmittance, while it has little effect on the crystalline quality of the β-Ga2O3 films. The significant changes in the electrical and optical properties of β-Ga2O3 may originate from the formation of shallow donor states and the passivation of the defects by the incorporated H. Temperature dependent electrical properties of the H-incorporated β-Ga2O3 films are also investigated, and the dominant scattering mechanisms at various temperatures are discussed. © 2021 Chinese Institute of Electronics.

Keyword:

β-Ga2O3 film scattering mechanisms hydrogen plasma treatment electrical properties defect

Author Community:

  • [ 1 ] [Jiang, Q.]Key Lab of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, 100083, China
  • [ 2 ] [Jiang, Q.]School of Information Science and Technology, North China University of Technology, Beijing, 100144, China
  • [ 3 ] [Meng, J.]Faculty of Science, Beijing University of Technology, Beijing, 100124, China
  • [ 4 ] [Shi, Y.]Key Lab of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, 100083, China
  • [ 5 ] [Shi, Y.]Faculty of Science, Beijing University of Technology, Beijing, 100124, China
  • [ 6 ] [Yin, Z.]Key Lab of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, 100083, China
  • [ 7 ] [Yin, Z.]Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, 100049, China
  • [ 8 ] [Chen, J.]Key Lab of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, 100083, China
  • [ 9 ] [Chen, J.]Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, 100049, China
  • [ 10 ] [Zhang, J.]School of Information Science and Technology, North China University of Technology, Beijing, 100144, China
  • [ 11 ] [Wu, J.]Key Lab of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, 100083, China
  • [ 12 ] [Zhang, X.]Key Lab of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, 100083, China
  • [ 13 ] [Zhang, X.]Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, 100049, China

Reprint Author's Address:

  • [Zhang, J.]School of Information Science and Technology, China;;[Zhang, X.]Key Lab of Semiconductor Materials Science, China

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Source :

Journal of Semiconductors

ISSN: 1674-4926

Year: 2022

Issue: 9

Volume: 43

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 14

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 8

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