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Author:

Shi, Yiming (Shi, Yiming.) | Meng, Junhua (Meng, Junhua.) (Scholars:孟军华) | Chen, Jingren (Chen, Jingren.) | Li, Yanmin (Li, Yanmin.) | Wu, Rui (Wu, Rui.) | Wu, Jinliang (Wu, Jinliang.) | Yin, Zhigang (Yin, Zhigang.) | Zhang, Xingwang (Zhang, Xingwang.)

Indexed by:

EI Scopus SCIE

Abstract:

Due to good lattice matching and bipolar doping behavior, wide bandgap SrTiO3 (STO) is a promising substrate for the heteroepitaxial growth of beta-Ga2O3 to construct heterojunctions for (opto-)electronic device applications. However, the investigation of the growth of beta-Ga2O3 film on the STO (111) substrate is still lacking. In this work, for the first time, the beta-Ga2O3 (2 01) thin films were epitaxially grown on the supercell matched STO (111) substrates by low pressure chemical vapor deposition. The effects of the source and growth temperatures on the surface roughness and crystalline quality of the beta-Ga2O3 films were systemically investigated. By controlling the supply of Ga source, the heteroepitaxial beta-Ga2O3 film grown under the optimized conditions exhibits a narrow X-ray diffraction rocking curve of 0.75 degrees and a low root-mean-square roughness of 1.10 nm. Furthermore, the epitaxial growth of beta-Ga2O3 films on the STO (10 0) substrate was also investigated. The heteroepitaxy of beta-Ga2O3 films on STO lays the foundation for future device applications of beta-Ga2O3-based heterojunctions.

Keyword:

&beta Crystalline quality Lattice match -Ga2O3 thin films Heteroepitaxy STO substrates

Author Community:

  • [ 1 ] [Shi, Yiming]Beijing Univ Technol, Fac Sci, Beijing 100124, Peoples R China
  • [ 2 ] [Meng, Junhua]Beijing Univ Technol, Fac Sci, Beijing 100124, Peoples R China
  • [ 3 ] [Li, Yanmin]Beijing Univ Technol, Fac Sci, Beijing 100124, Peoples R China
  • [ 4 ] [Wu, Rui]Beijing Univ Technol, Fac Sci, Beijing 100124, Peoples R China
  • [ 5 ] [Shi, Yiming]Chinese Acad Sci, Inst Semicond, Key Lab Semicond Mat Sci, Beijing 100083, Peoples R China
  • [ 6 ] [Chen, Jingren]Chinese Acad Sci, Inst Semicond, Key Lab Semicond Mat Sci, Beijing 100083, Peoples R China
  • [ 7 ] [Wu, Jinliang]Chinese Acad Sci, Inst Semicond, Key Lab Semicond Mat Sci, Beijing 100083, Peoples R China
  • [ 8 ] [Yin, Zhigang]Chinese Acad Sci, Inst Semicond, Key Lab Semicond Mat Sci, Beijing 100083, Peoples R China
  • [ 9 ] [Zhang, Xingwang]Chinese Acad Sci, Inst Semicond, Key Lab Semicond Mat Sci, Beijing 100083, Peoples R China
  • [ 10 ] [Chen, Jingren]Univ Chinese Acad Sci, Ctr Mat Sci & Optoelect Engn, Beijing 100049, Peoples R China
  • [ 11 ] [Yin, Zhigang]Univ Chinese Acad Sci, Ctr Mat Sci & Optoelect Engn, Beijing 100049, Peoples R China
  • [ 12 ] [Zhang, Xingwang]Univ Chinese Acad Sci, Ctr Mat Sci & Optoelect Engn, Beijing 100049, Peoples R China

Reprint Author's Address:

  • [Meng, Junhua]Beijing Univ Technol, Fac Sci, Beijing 100124, Peoples R China;;

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Source :

APPLIED SURFACE SCIENCE

ISSN: 0169-4332

Year: 2023

Volume: 616

6 . 7 0 0

JCR@2022

ESI Discipline: MATERIALS SCIENCE;

ESI HC Threshold:26

Cited Count:

WoS CC Cited Count: 10

SCOPUS Cited Count: 11

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 8

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