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Author:

Dong, Xiangming (Dong, Xiangming.) | Liu, Shibing (Liu, Shibing.) (Scholars:刘世炳) | Song, Haiying (Song, Haiying.)

Indexed by:

EI Scopus PKU CSCD

Abstract:

The films of nanoscale-carbonare is formed through laser exfoliation of graphite on the substrate silicon (Si) without a catalytic layer and the chamber is vacuumed to 1.33×10-4 Pa in the growth process. The femtosecond (fs) laser exfoliation process is investigated at different laser fluences and deposition time. The composition of the carbon films deposited at different pulse energies and irradiation time are detected by the visible Raman spectroscopy. Scanning electron microscope (SEM) and atomic force microscope are used to display the surface of the thin films. The results show that the deposition time influences ratio of ID/IG, microstructure, the grain size of the carbon. High-intensity femtosecond laser pulse energy can promote the crystallization of carbon particles. Some special particles (pattern-snowflake-like, cube and quadrangle), which are formed by femtosecond laser pulse ablates a graphite at a high laser fluence, particles are found on the sample surface. ©, 2015, Science Press. All right reserved.

Keyword:

Deposition Femtosecond lasers Carbon films Atomic force microscopy Graphite Laser pulses Thin films Exfoliation (materials science) Scanning electron microscopy Electromagnetic pulse

Author Community:

  • [ 1 ] [Dong, Xiangming]Strong-Field and Ultrafast Photonics Labrary, Institute of Laser Engineering, Beijing University of Technology, Beijing; 100124, China
  • [ 2 ] [Liu, Shibing]Strong-Field and Ultrafast Photonics Labrary, Institute of Laser Engineering, Beijing University of Technology, Beijing; 100124, China
  • [ 3 ] [Song, Haiying]Strong-Field and Ultrafast Photonics Labrary, Institute of Laser Engineering, Beijing University of Technology, Beijing; 100124, China

Reprint Author's Address:

  • 刘世炳

    [liu, shibing]strong-field and ultrafast photonics labrary, institute of laser engineering, beijing university of technology, beijing; 100124, china

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Source :

Chinese Journal of Lasers

ISSN: 0258-7025

Year: 2015

Issue: 8

Volume: 42

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 3

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 12

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