Compared　to　traditional　mercury　UV-light　sources,　ultraviolet　light-emitting　diodes　(UV　LEDs)　as　a　new　solid-state　ultraviolet　light　source,　has　been　applied　in　fields　such　as　disinfection,　medical　diagnosis,　phototherapy,　solidification,　detection,　and　sensing　due　to　its　many　advantages.　At　present,　ultraviolet　LED　technology　has　achieved　rapid　development,　in　order　to　predict　the　lifetime　of　UV　LEDs　quickly,　analyzing　the　failure　mechanism　of　UV　LEDs　and　selecting　suitable　lifetime　prediction　programmes　are　of　significance　importance　for　improving　reliability.　Therefore,　this　article　focuses　on　the　accelerated　life　testing　(ALT)　and　accelerated　degradation　testing　(ADT)　based　on　UV　LEDs,　summarizes　the　lifetime　prediction　methods　reported　in　domestic　and　foreign　literature,　introduces　the　principles　and　applicable　scenarios　of　different　lifetime　prediction　methods.his　article　summarizes　the　lifetime　prediction　methods　of　ultraviolet　LEDs,　and　provides　reference　for　the　reliability　research　of　UV　LEDs.　©　2023　IEEE.