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Abstract：
In order to detect the MOSFET junction temperature, the paper measures the MOSFET junction temperature by electrical method without affecting the normal operation of the devices and the circuits. In addition, the method of optimizing the temperature calibration curve proposed is helpful for engineers to efficiently monitor the junction temperature and prevent the risk of failure caused by high temperature. © 2019 IOP Publishing Ltd. All rights reserved.
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ISSN： 1742-6588
Year： 2019
Issue： 3
Volume： 1237
Language： English
Cited Count：
WoS CC Cited Count： 0
SCOPUS Cited Count：
ESI Highly Cited Papers on the List： 0 Unfold All
WanFang Cited Count：
Chinese Cited Count：
30 Days PV： 4
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