• Complex
  • Title
  • Keyword
  • Abstract
  • Scholars
  • Journal
  • ISSN
  • Conference
搜索

Author:

Bie, Xiaorui (Bie, Xiaorui.) | Qin, Fei (Qin, Fei.) (Scholars:秦飞) | An, Tong (An, Tong.) | Zhao, Jingyi (Zhao, Jingyi.) | Fang, Chao (Fang, Chao.)

Indexed by:

EI Scopus

Abstract:

As the demand of power converter for higher power density is increasing, bonding wire failure of IGBT module becomes more severe. Accordingly, it is of great significance to investigate the reliability of bonding wire under operating condition for improving the reliability of IGBT module. In this paper, the finite element model of IGBT module was established, and a two-step indirect coupling electro-thermal-mechanical analysis was conducted to evaluate the wire bonding reliability of IGBT module under the power cylcing. The thermal-mechanical analysis results indicate that the maximum equivalent plastic strain occurs at the corner of the bonded interface between the outermost bonding wire and the chip, where the cracks may initiate and then propagate along the interface, which is consistent with the observations of experimental results. It suggests that the outermost bonding wire is more likely to fail. © 2017 IEEE.

Keyword:

Insulated gate bipolar transistors (IGBT) Reliability Wire Reliability analysis Electronics packaging

Author Community:

  • [ 1 ] [Bie, Xiaorui]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, China
  • [ 2 ] [Qin, Fei]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, China
  • [ 3 ] [An, Tong]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, China
  • [ 4 ] [Zhao, Jingyi]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, China
  • [ 5 ] [Fang, Chao]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, China

Reprint Author's Address:

Email:

Show more details

Related Keywords:

Related Article:

Source :

Year: 2017

Page: 1396-1401

Language: English

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 24

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

Online/Total:539/10555146
Address:BJUT Library(100 Pingleyuan,Chaoyang District,Beijing 100124, China Post Code:100124) Contact Us:010-67392185
Copyright:BJUT Library Technical Support:Beijing Aegean Software Co., Ltd.