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Author:

Tang, Zhanghong (Tang, Zhanghong.) | Wang, Qun (Wang, Qun.) (Scholars:王群) | Guo, Hongxia (Guo, Hongxia.) (Scholars:郭红霞) | Shi, Meiwu (Shi, Meiwu.) | Li, Maohui (Li, Maohui.)

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EI Scopus

Abstract:

Basing on the posteriori error estimation and Superconvergent Patch Recovery (SPR) technology, Elena Zhelezina proposed a fast adaptive mesh refinement strategy which can generate the refined mesh for the required accuracy with only one step of refinement. However, the strategy generates too many elements in PPFDs which is unpractical to simulate the PCBs and IC packages with complicated multiple layers, where the electromagnetic field in PPFDs is calculated, since too many elements lead to the FEM sparse matrices can't be solved on current machines because of inefficient memory. In this paper, a new formula to estimate the global error is introduced, and then, a new strategy to calculate every element's refinement degree is presented. Results show that the improved method generates less than half of elements comparing to Elena Zhelezina's method, but still requires only one step refinement. This mesh refinement strategy was successfully applied to calculate the electromagnetic field in PPFDs for simulating the PCBs and IC packages with high accuracy.

Keyword:

Integrated circuits Polychlorinated biphenyls Printed circuit boards Finite element method Mesh generation Electromagnetic fields Organic pollutants

Author Community:

  • [ 1 ] [Tang, Zhanghong]College of Materials Science and Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 2 ] [Wang, Qun]College of Materials Science and Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 3 ] [Guo, Hongxia]College of Materials Science and Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 4 ] [Shi, Meiwu]Quartermaster Equipment Research Institute, General Logistics Department, PLA, Beijing 100082, China
  • [ 5 ] [Li, Maohui]Quartermaster Equipment Research Institute, General Logistics Department, PLA, Beijing 100082, China

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Source :

Year: 2009

Page: 324-327

Language: English

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 2

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 6

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