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Author:

Lu, Wei (Lu, Wei.) | Shi, Yaowu (Shi, Yaowu.) | Lei, Yongping (Lei, Yongping.) (Scholars:雷永平)

Indexed by:

EI Scopus SCIE

Abstract:

In the present work, the effect of Ag content on solidification cracking susceptibility of Sn-Ag-Cu solder joints has been investigated. Solders containing 1.0 wt.% to 3.8 wt.% Ag were used in the experiment. Solidification cracks were created using a copper self-restraint specimen, which could simulate the process of solidification cracking. Meanwhile, solidification cracking susceptibility was evaluated by comparing the total crack length of the solder joint. The results indicate that solidification cracks exist in solder joints with 1.0 wt.% to 3.0 wt.% Ag content, whereas there are no cracks in Sn-3.8Ag-0.7Cu solder joints. When the Ag content increases from 1.0 wt.% to 3.0 wt.%, the total crack length of Sn-Ag-Cu solder joints increases to a maximum and then drops to zero when the Ag content reaches 3.8 wt.%. In addition, the susceptibility to solidification cracking is observed as follows: SAC207 > SAC305 > SAC107 > SAC387.

Keyword:

solidification cracks Sn-Ag-Cu solder joints cracking susceptibility

Author Community:

  • [ 1 ] [Lu, Wei]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing 100124, Peoples R China
  • [ 2 ] [Shi, Yaowu]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing 100124, Peoples R China
  • [ 3 ] [Lei, Yongping]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing 100124, Peoples R China

Reprint Author's Address:

  • [Lu, Wei]Beijing Univ Technol, Coll Mat Sci & Engn, 100 Pingleyuan, Beijing 100124, Peoples R China

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Source :

JOURNAL OF ELECTRONIC MATERIALS

ISSN: 0361-5235

Year: 2010

Issue: 8

Volume: 39

Page: 1298-1302

2 . 1 0 0

JCR@2022

ESI Discipline: MATERIALS SCIENCE;

JCR Journal Grade:2

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count: 5

SCOPUS Cited Count: 6

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 4

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