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Author:

Yan, Shuaiqi (Yan, Shuaiqi.) | Geng, Shuqin (Geng, Shuqin.) | Peng, Xiaohong (Peng, Xiaohong.) | Tang, Haonan (Tang, Haonan.) | Zhang, Yan (Zhang, Yan.) | Wang, Zifeng (Wang, Zifeng.)

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EI Scopus

Abstract:

This article focuses on the design of a system-level verification platform for a static random-access memory (SRAM) module. The SRAM module is in a CAN-FD SOC chip. The SRAM memory controller verified by the verification platform in this paper is an important module integrated on the APB SOC chip bus for basic communication with CAN-FD IP. By adopting UVM universal verification methodology, a complete verification platform and verification environment suitable for the module are designed and built; by generating constrained random test excitation signals, the function of the controller is fully verified, and the results can be automatically compared with the data. The results show that the verification platform can greatly reduce the development time of verification incentives, simplify the verification process, shorten the verification cycle and have good reusability. © 2020 IEEE.

Keyword:

Controllers Programmable logic controllers System-on-chip Finite difference method Static random access storage Reusability Integrated circuit design

Author Community:

  • [ 1 ] [Yan, Shuaiqi]Vlsi and System Lab, Beijing University of Technology, Beijing, China
  • [ 2 ] [Geng, Shuqin]Vlsi and System Lab, Beijing University of Technology, Beijing, China
  • [ 3 ] [Peng, Xiaohong]Vlsi and System Lab, Beijing University of Technology, Beijing, China
  • [ 4 ] [Tang, Haonan]Vlsi and System Lab, Beijing University of Technology, Beijing, China
  • [ 5 ] [Zhang, Yan]Vlsi and System Lab, Beijing University of Technology, Beijing, China
  • [ 6 ] [Wang, Zifeng]Vlsi and System Lab, Beijing University of Technology, Beijing, China

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Source :

Year: 2020

Page: 218-222

Language: English

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 4

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