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Author:

Jie, Bai (Jie, Bai.) | Fei, Qin (Fei, Qin.) (Scholars:秦飞) | Tong, An (Tong, An.) | Chen, Na (Chen, Na.)

Indexed by:

EI Scopus

Abstract:

Peeling stress of solder joints is critical to assess the reliability of packages under drop/impact loadings. Numerical simulation is one important tool to tackle this issue. Usually an implicit dynamic transient finite element (FE) is used to conduct the drop/impact analysis of PCB board level packages under a specific drop condition. However, even using the most update computer this kind of simulation is time consuming. Therefore some researchers and engineers proposed an alternative static analysis as first order estimation of peeling stress. The alternative static models can be classified into two types. One is based on PCB bending moment equivalent, i.e, let the bending moment of PCB in the static model equal to the moment in a prior dynamic analysis, and then evaluate peeling stress by the static model. Another is based on PCB deflection equivalent in which the PCB deflection in the static model identifies to the greatest deflection of PCB in dynamic analysis. From the view of that the peeling stress is caused by the bending stiffness difference between the package and the PCB the package attached, it seems that the deflection equivalent scheme is more reasonable. However, there is no research reported in which a through investigation was conducted to verify the effectiveness of the static model. In this paper, a very detailed finite element model of PCB board and BGA package was constructed. A dynamic drop/impact simulation of the board-level package was conducted by LS-DYNA and Input-G approach under the drop Condition H recommended by JEDEC standard JESD22-B111. A PCB deflection equivalent static analysis was conducted also in order to investigate the difference of peeling stress between the dynamic and the static model. ©2007 IEEE.

Keyword:

Packaging Static analysis Deflection (structures) Printed circuit boards Bending moments Drops Finite element method Electronics packaging

Author Community:

  • [ 1 ] [Jie, Bai]School of Mechanical Engineering and Applied Electronic Technology, Beijing University of Technology, Beijing 100022, China
  • [ 2 ] [Fei, Qin]School of Mechanical Engineering and Applied Electronic Technology, Beijing University of Technology, Beijing 100022, China
  • [ 3 ] [Tong, An]School of Mechanical Engineering and Applied Electronic Technology, Beijing University of Technology, Beijing 100022, China
  • [ 4 ] [Chen, Na]School of Mechanical Engineering and Applied Electronic Technology, Beijing University of Technology, Beijing 100022, China

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Year: 2007

Language: English

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ESI Highly Cited Papers on the List: 0 Unfold All

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30 Days PV: 6

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