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Author:

Mao, Mingming (Mao, Mingming.) | Xu, Chen (Xu, Chen.) (Scholars:徐晨) | Wei, Simin (Wei, Simin.) | Xie, Yiyang (Xie, Yiyang.) | Cao, Tian (Cao, Tian.)

Indexed by:

CPCI-S EI Scopus

Abstract:

Three different aperture diameters (6 mu m, 8 mu m, 10 mu m) of proton implantation vertical cavity surface emitting lasers (VCSEL) are fabricated by two different group energy bombardment, where the epitaxial structure is designed lasing at 850nm. The injection energy is 300kev, 230kev and 330kev, 250kev, 160kev respectively, in order to confine the current path. To avoid channel effect while injecting and to make the actual fabrication process behind convenient, 5000 angstrom SiO2 was deposited on the surface of the wafer. Photoresist and Au are used as the mask to protect the lasing area against bombardment, respectively. When the aperture diameters is 10 mu m and under the two times bombardment, the output power of continuously at room temperature is reached at 2.4mw, while the same aperture diameters under three times bombardment is only 0.5mw. Further analysis indicates that the distance of injection peak value from the active region is a critical parameter to determine the output power.

Keyword:

vertical cavity surface emitting lasers (VCSEL) proton implantation injection energy

Author Community:

  • [ 1 ] [Mao, Mingming]Beijing Univ Technol, Key Lab Optoelect Technol, Beijing 100124, Peoples R China
  • [ 2 ] [Xu, Chen]Beijing Univ Technol, Key Lab Optoelect Technol, Beijing 100124, Peoples R China
  • [ 3 ] [Wei, Simin]Beijing Univ Technol, Key Lab Optoelect Technol, Beijing 100124, Peoples R China
  • [ 4 ] [Xie, Yiyang]Beijing Univ Technol, Key Lab Optoelect Technol, Beijing 100124, Peoples R China
  • [ 5 ] [Cao, Tian]Beijing Univ Technol, Key Lab Optoelect Technol, Beijing 100124, Peoples R China

Reprint Author's Address:

  • [Mao, Mingming]Beijing Univ Technol, Key Lab Optoelect Technol, Beijing 100124, Peoples R China

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Source :

PHOTONICS AND OPTOLECTRONICS MEETINGS (POEM) 2011: OPTOELECTRONIC DEVICES AND INTEGRATION

ISSN: 0277-786X

Year: 2011

Volume: 8333

Language: English

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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