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Author:

Qian, Fengsong (Qian, Fengsong.) | Deng, Jun (Deng, Jun.) | Dong, Yibo (Dong, Yibo.) | Xu, Chen (Xu, Chen.) (Scholars:徐晨) | Hu, Liangchen (Hu, Liangchen.) | Fu, Guosheng (Fu, Guosheng.) | Chang, Pengying (Chang, Pengying.) | Xie, Yiyang (Xie, Yiyang.) | Sun, Jie (Sun, Jie.)

Indexed by:

EI Scopus SCIE

Abstract:

Direct chemical vapor deposition of graphene on semiconductors and insulators provides high feasibility for integration of graphene devices and semiconductor electronics. However, the current methods typically rely on high temperatures (>1000 degrees C), which can damage the substrates. Here, a growth method for high-quality large-area graphene at 300 degrees C is introduced. A multizone furnace with gradient temperature control was designed according to a computational fluid dynamics model. The crucial roles of the chamber pressure in the film continuity and hydrogen composition in the graphene defect density at low temperature were revealed. As a result, a uniform graphene film with the Raman ratio ID/IG = 0.08 was obtained. Furthermore, a technique of laminating single-crystal Cu foil as a sacrificial layer on the substrate was proposed to realize transfer-free growth, and a wafer-scale graphene transistor array was demonstrated with good performance consistency, which paves the way for mass fabrication of graphene devices.

Keyword:

wafer scale transistor array low temperature growth graphene gradient temperature transfer-free

Author Community:

  • [ 1 ] [Qian, Fengsong]Beijing Univ Technol, Key Lab Optoelect Technol, Minist Educ, Beijing 100124, Peoples R China
  • [ 2 ] [Deng, Jun]Beijing Univ Technol, Key Lab Optoelect Technol, Minist Educ, Beijing 100124, Peoples R China
  • [ 3 ] [Xu, Chen]Beijing Univ Technol, Key Lab Optoelect Technol, Minist Educ, Beijing 100124, Peoples R China
  • [ 4 ] [Hu, Liangchen]Beijing Univ Technol, Key Lab Optoelect Technol, Minist Educ, Beijing 100124, Peoples R China
  • [ 5 ] [Chang, Pengying]Beijing Univ Technol, Key Lab Optoelect Technol, Minist Educ, Beijing 100124, Peoples R China
  • [ 6 ] [Xie, Yiyang]Beijing Univ Technol, Key Lab Optoelect Technol, Minist Educ, Beijing 100124, Peoples R China
  • [ 7 ] [Dong, Yibo]Univ Shanghai Sci & Technol, Inst Photon Chips, Shanghai 200093, Peoples R China
  • [ 8 ] [Fu, Guosheng]Beihang Univ, Fert Beijing Inst, Beijing 100191, Peoples R China
  • [ 9 ] [Fu, Guosheng]Beihang Univ, Sch Microelect, Beijing 100191, Peoples R China
  • [ 10 ] [Sun, Jie]Fuzhou Univ, Natl & Local United Engn Lab Flat Panel Display Te, Fuzhou 350100, Peoples R China
  • [ 11 ] [Sun, Jie]Mindu Innovat Lab, Fuzhou 350100, Peoples R China

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Source :

ACS APPLIED MATERIALS & INTERFACES

ISSN: 1944-8244

Year: 2022

Issue: 47

Volume: 14

Page: 53174-53182

9 . 5

JCR@2022

9 . 5 0 0

JCR@2022

ESI Discipline: MATERIALS SCIENCE;

ESI HC Threshold:66

JCR Journal Grade:1

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count: 8

SCOPUS Cited Count: 8

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 5

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