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Author:

Zhang, Bin (Zhang, Bin.) | Su, Rong (Su, Rong.) | Feng, Shiwei (Feng, Shiwei.) (Scholars:冯士维) | Zhang, Guangchen (Zhang, Guangchen.) | Guo, Chunsheng (Guo, Chunsheng.) | Liu, Yin (Liu, Yin.) | Ding, Kaikai (Ding, Kaikai.)

Indexed by:

EI Scopus

Abstract:

The thermal analysis of ICs has been studied in different methods for years. In this paper, a new method to analyze the steady-state temperature distribution of integrated circuit is presented. According to equivalent thermal resistance formula obtaining by an aid tool ANSYS and programming idea, the temperature distribution graph of an analog integrated circuit is obtained. And the result is verified by a complete ANSYS analysis. ©2009 IEEE.

Keyword:

Thermoanalysis Temperature distribution Failure analysis Analog integrated circuits Failure (mechanical)

Author Community:

  • [ 1 ] [Zhang, Bin]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 2 ] [Su, Rong]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 3 ] [Feng, Shiwei]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 4 ] [Zhang, Guangchen]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 5 ] [Guo, Chunsheng]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 6 ] [Liu, Yin]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 7 ] [Ding, Kaikai]School of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China

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Source :

Year: 2009

Page: 538-540

Language: English

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 7

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